独立行政法人日本学術振興会 特別研究員 (DC2)

2013.4 - 2014.1

A Fully Integrated Digital LDO With Adaptive Sampling and Statistical Comparator Selection Reviewed

Shun Yamaguchi, Takashi Hisakado, Osami Wada, Mahfuzul Islam

IEEE Solid-State Circuits Letters   7   163 - 166   2024

An Adaptive-Sampling Digital LDO with Statistical Comparator Selection Achieving 99.99% Maximum Current Efficiency and 0.25ps FoM in 65nm

Shun Yamaguchi, Takashi Hisakado, Osami Wada, Mahfuzul Islam

2023 IEEE Asian Solid-State Circuits Conference (A-SSCC)   2023.11

CMOS temperature sensor capable of -40～140℃ range utilizing statistical properties of scaled MOSFETs

Shinichi, Ota, Mahfuzul, Islam, Takashi, Hisakado

2023   41 - 47   2023.8

High-Performance Flash ADC Using Reconfigurable Comparators with Self-Calibration Mechanism

Yuma, Iwta, Mahfuzul, Islam, Takashi, Hisakado

2023   48 - 55   2023.8

High-Efficiency Design of On-Chip Switched-Capacitor Converter by Utilizing Substrate Bias Effect of MOSFETs

Koji, Kikuta, Mahfuzul, Islam, Takashi, Hisakado

2023   8 - 14   2023.8

CMOS Temperature Sensor Utilizing Gate-length-based Threshold Voltage Modulation Reviewed

Mahfuzul Islam, Shogo Harada, Takashi Hisakado, Osami Wada

2023 21st IEEE Interregional NEWCAS Conference (NEWCAS)   1 - 5   2023.6

Real-time Temperature Estimation of SiC MOSFETs Using Gate Voltage at Zero-current Switching for Inverter Applications Reviewed

Raul R. Rodriguez G., Mahfuzul Islam, Takashi Hisakado, Osami Wada

11th International Conference on Power Electronics and ECCE Asia (ICPE 2023 - ECCE Asia)   2023.5

Wide-range and low supply dependency MOSFET-based temperature sensor utilizing statistical properties of scaled MOSFETs Reviewed

Shinichi Ota, Mahfuzul Islam, Takashi Hisakado, Osami Wada

Japanese Journal of Applied Physics   62 ( SC )   2023.4

A Fully Synchronous Digital LDO with Built-in Adaptive Frequency Modulation and Implicit Dead-Zone Control Reviewed

Shun Yamaguchi, Mahfuzul Islam, Takashi Hisakado, Osami Wada

Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC   186 - 187   2023.1

Demonstration of Order Statistics Based Flash ADC in a 65nm Process Reviewed

Mahfuzul Islam, Takehiro Kitamura, Takashi Hisakado, Osami Wada

Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC   188 - 189   2023.1

Single-Conductor Transmission-Line Model for Bent Wire Structures Reviewed

Daiki Tashiro, Kana Sameshima, Takashi Hisakado, A. K. M. Mahfuzul Islam, Osami Wada

IEEE Transactions on Electromagnetic Compatibility   1 - 14   2023

Global stabilization for nonlinear two-port characteristics of bidirectional DC/DC converter and its application to peer-to-peer energy transfer Reviewed

Kenta Yamamoto, Takashi Hisakado, Mahfuzul Islam, Osami Wada

Nonlinear Theory and Its Applications, IEICE   14 ( 2 )   292 - 307   2023

Measurement of Temperature Effect on Comparator Offset Voltage Variation Reviewed

Yuma Iwata, Takehiro Kitamura, Mahfuzul Islam

IEEE International Conference on Microelectronic Test Structures   2023-March   2023

Low-Power Design of Digital LDO with Adaptive Frequency Scaling based on MOSFETs' subthreshold current

Shun, Yamaguchi, Mahfuzul, Islam, Takashi, Hisakado, Osami, Wada

2022   113 - 119   2022.8

Temperature sensing method utilizing a statistical property of sub-threshold MOSFET currents

Shinichi, Ota, Mahfuzul, Islam, Takashi, Hisakado, Osami, Wada

2022   201 - 206   2022.8

Performance Improvement of Order Statistics Based Flash ADC Using Multiple Comparator Groups Reviewed

Takehiro Kitamura, Mahfuzul Islam, Takashi Hisakado, Osami Wada

IEEE International NEWCAS Conference   1 - 4   2022.6

On-chip leakage current variation measurement using external-reference-free current-to-time conversion for densely placed MOSFETs Reviewed

Mahfuzul Islam, Shogo Harada

Japanese Journal of Applied Physics   61 ( SC )   SC1056 - SC1056   2022.5

Order Statistics Based Low-power Flash ADC with On-chip Comparator Selection Reviewed

Takehiro KITAMURA, Mahfuzul ISLAM, Takashi HISAKADO, Osami WADA

IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences   E105A ( 11 )   1450 - 1457   2022.5

Homogeneous ring oscillator with staggered layout for gate-level delay characterization Reviewed

Misaki Udo, Mahfuzul Islam, Hidetoshi Onodera

IEEE International Microelectronic Test Structures (ICMTS)   2022-March   99 - 104   2022.3

Low-Power Design of Digital LDO With Non-linear Symmetric Frequency Generation Reviewed

Shun Yamaguchi, Mahfuzul Islam, Takashi Hisakado, Osami Wada

IEEE Transactions on Circuits and Systems II: Express Briefs   69 ( 12 )   1 - 1   2022

A process scalable voltage-reference-free temperature sensor utilizing MOSFET threshold voltage variation Reviewed

Shogo Harada, Mahfuzul Islam, Takashi Hisakado, Osami Wada

2021 IEEE Asian Solid-State Circuits Conference (A-SSCC)   2021.11

On-chip leakage current variation measurement using reference-free current-to-time conversion Reviewed

Mahfuzul Islam, Shogo Harada

International Conference on Solid State Devices and Materials   2021.9

CDF Distance Based Statistical Parameter Extraction Using Nonlinear Delay Variation Models Reviewed

Kensuke Murakami, Mahfuzul Islam, Hidetoshi Onodera

27th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS)   2021.6

Flash ADC Utilizing Offset Voltage Variation With Order Statistics Based Comparator Selection Reviewed

Takehiro Kitamura, Mahfuzul Islam, Takashi Hisakado, Osami Wada

International Symposium on Quality Electronic Design (ISQED)   2021-April   103 - 108   2021.3

Power Equalization of Peer-to-Peer Energy Transfer in Star Networks Using Broadcast from Reference Voltage Source

Masaki Kawamoto, Takashi Hisakado, Mahfuzul Islam, Osami Wada

International Symposium on Nonlinear Theory and Its Applications   2020.11

A 6.4 nW 1.7% Relative Inaccuracy CMOS Temperature Sensor Utilizing Sub-thermal Drain Voltage Stabilization and Frequency Locked Loop Reviewed

Teruki Someya, A.K.M. Mahfuzul Islam, Kenichi Okada

IEEE Solid-State Circuits Letter   3   458 - 461   2020.11

Excitation of the Light Line Mode with Metamaterials Composed of Parallel Conductors Based On Equivalent-Circuit Model Including Retarded Electromagnetic Coupling Reviewed

Daisuke Akimaru, Takashi Hisakado, Mahfuzul Islam, Osami Wada

International Congress on Artificial Materials for Novel Wave Phenomena   2020.9

Power Device Degradation Estimation by Machine Learning of Gate Waveforms

Hiromu Yamasaki, Koutaro Miyazaki, Yang Lo, A. K. M. Mahfuzul Islam, Katsuhiro Hata, Takayasu Sakurai, Makoto Takamiya

International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)   2020-September   335 - 338   2020.9

RTN-induced Delay Fluctuation under Dynamic Supply and Back-gate Voltage Tuning

2020   65 - 71   2020.8

Monte Carlo-based Delay Variation Analysis with Non-Linear Circuit Delay Model

Kensuke, Murakami, Mahfuzul, Islam, Hidetoshi, Onodera

2020   59 - 64   2020.8

Design of Flash ADC Based on Order Statistics with On-chip Comparator Selection

Takehiro, Kitamura, Mahfuzul, Islam, Takashi, Hisakado, Osami, Wada

2020   8 - 14   2020.8

Time-domain Wide-supply-voltage CMOS Temperature Sensor utilizing Threshold Voltage Difference

Shogo, Harada, Mahfuzul, Islam, Takashi, Hisakado, Osami, Wada

2020   15 - 21   2020.8

Increased Delay Variability due to Random Telegraph Noise under Dynamic Back-gate Tuning Reviewed

Misaki Udo, Kensuke Murakami, A. K. M. Mahfuzul Islam, Hidetoshi Onodera

IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS)   2020-May   1 - 6   2020.5

Random telegraph noise under switching operation

Kazutoshi Kobayashi, Mahfuzul Islam, Takashi Matsumoto, Ryo Kishida

Noise in Nanoscale Semiconductor Devices   285 - 333   2020.4

Transients of Gyrator Network of Bidirectional AC/DC Converters in Peer-to-Peer Energy Transfer Reviewed

Nobuhiko Kawashima, Takashi Hisakado, A.K.M. Mahfuzul Islam, Osami Wada

International Symposium on Nonlinear Theory and Its Applications (NOLTA)   2 - 6   2019.12

Circuit Techniques for Device-Circuit Interaction toward Minimum Energy Operation Invited Reviewed

A.K.M. Mahfuzul Islam, Hidetoshi Onodera

IPSJ Transactions on System LSI Design Methodology   12   2 - 12   2019.12

Topological Tuning of a Dispersion Curve by Controlling Locations of Impurities with Equivalent Circuit Model Reviewed

Akira Hasegawa, Takashi Hisakado, A.K.M. Mahfuzul Islam, Osami Wada

International Congress on Artificial Materials for Novel Wave Phenomena (Metamaterials)   149 - 151   2019.9

CNN-based Approach for Estimating Degradation of Power Devices by Gate Waveform Monitoring Reviewed

K. Miyazaki, Y. Lo, A. K. M, M. Islam, K. Hata, M. Takamiya, T. Sakurai

Proceedings of IEEE International Conference on IC Design and Technology (ICICDT)   104 - 107   2019.6

Analysis of Random Telegraph Noise (RTN) at Near-threshold Operation by Measuring 154k Ring Oscillators, Reviewed

A.K.M. Mahfuzul Islam, Ryota Shimizu, Hidetoshi Onodera

Proceedings of IEEE International Reliability Physics Symposium (IRPS)   2019-March   1 - 6   2019.4

Drive-Strength Selection for Synthesis of Leakage-Dominant Circuits Reviewed

A.K.M. Mahfuzul Islam, Shinichi Nishizawa, Yusuke Matsui, Yoshinobu Ichida

Proceedings of International Symposium on Quality Electronic Design (ISQED)   2019-March   298 - 303   2019.3

Effect of Logic Depth and Switching Speed on Random Telegraph Noise Induced Delay Fluctuation Reviewed

A.K.M. Mahfuzul Islam, Ryota Shimizu, Hidetoshi Onodera

Proceedings of International Conference on Microelectronic Test Structure (ICMTS)   2019-March   166 - 170   2019.3

An 11-nW CMOS Temperature-to-Digital Converter Utilizing Sub-Threshold Current at Sub-Thermal Drain Voltage Reviewed

Teruki Someya, A.K.M. Mahfuzul Islam, Takayasu Sakurai, Makoto Takamiya

IEEE Journal of Solid-State Circuits   54 ( 3 )   613 - 622   2019

PVT2: Process, Voltage, Temperature and Time-dependent Variability in Scaled CMOS Process, Invited Reviewed

A.K.M. Mahfuzul Islam, Hidetoshi Onodera

Proceedings of IEEE/ACM International Conference on Computer Aided Design (ICCAD)   1 - 6   2018.11

Worst-case Performance Analysis Under Random Telegraph Noise Induced Threshold Voltage Variability Reviewed

A.K.M. Mahfuzul Islam, Hidetoshi Onodera

Proceedings of ACM International Symposium on Power and Timing Modeling, Optimization and Simulation   140 - 146   2018.7

DU-MD: An Open-Source Human Action Dataset for Ubiquitous Wearable Sensors Reviewed

Swapnil Sayan Saha, Shafizur Rahman, Miftahul Jannat Rasna, A.K.M. Mahfuzul Islam, Md. Atiqur, Rahman Ahad

Proceedings of 7th International Conference on Informatics, Electronics and Vision   567 - 572   2018.6

A 13nW Temperature-to-Digital Converter Utilizing Sub-threshold MOSFET Operation at Sub-thermal Drain Voltage Reviewed

Teruki Someya, A.K.M. Mahfuzul Islam, Takayasu Sakurai, Makoto Takamiya

Proceedings of IEEE Custom Integrated Circuits Conference (CICC)   1 - 4   2018.4

Measurement of Temperature Effect on Random Telegraph Noise Induced Delay Fluctuation Reviewed

A.K.M. Mahfuzul Islam, Masashi Oka, Hidetoshi Onodera

Proceedings of International Conference on Microelectronic Test Structure (ICMTS)   2018-March   2010 - 2015   2018.3

Feature Extraction, Performance Analysis and System Design using the DU Mobility Dataset Reviewed

Swapnil Sayan Saha, Shafizur Rahman, Miftahul Jannat Rasna, Tarek Bin Zahid, A.K.M. Mahfuzul Islam, Md. Atiqur, Rahman Ahad

IEEE Access   6   44776 - 447886   2018

Supply Voltage Effect on Random Telegraph Noise Induced Delay Variation, Reviewed

A.K.M. Mahfuzul Islam, Hidetoshi Onodera

IEEE/ACM Workshop on Variability Modeling and Characterization   2017.11

Effect of supply voltage on random telegraph noise of transistors under switching condition Reviewed

A.K.M. Mahfuzul Islam, Hidetoshi Onodera

Power and Timing Modeling, Optimization and Simulation (PATMOS), 2017 27th International Symposium on   2017-January   1 - 8   2017.9

Statistical Analysis and Modeling of Random Telegraph Noise Based on Gate Delay Measurement Reviewed

A. K. M. Mahfuzul Islam, Tatsuya Nakai, Hidetoshi Onodera

IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING   30 ( 3 )   216 - 226   2017.8

Programmable Neuron Array Based on a 2-Transistor Multiplier Using Organic Floating-Gate for Intelligent Sensors Reviewed

A. K. M. Mahfuzul Islam, Masamune Hamamatsu, Tomoyuki Yokota, Sunghoon Lee, Wakako Yukita, Makoto Takamiya, Takao Someya, Takayasu Sakurai

IEEE JOURNAL ON EMERGING AND SELECTED TOPICS IN CIRCUITS AND SYSTEMS   7 ( 1 )   81 - 91   2017.3

A Statistical Modeling Methodology of RTN Gate Size Dependency Based on Skewed Ring Oscillators Reviewed

A. K. M. Mahfuzul Islam, Tatsuya Nakai, Hidetoshi Onodera

2017 INTERNATIONAL CONFERENCE OF MICROELECTRONIC TEST STRUCTURES (ICMTS)   2017

Statistical Analysis of Random Telegraph Noize with Ring Oscillator

Tatsuya, Nakai, Hidenori, Gyoten, A.K.M., Mahfuzul Islam, Hidetoshi, Onodera

2016 ( 35 )   187 - 192   2016.9

Sensor and Circuit Solutions for Organic Flexible Electronics Reviewed

A.K.M. Mahfuzul Islam, Hiroshi Fuketa, Koichi Ishida, Tomoyuki Yokota, Tsuyoshi Sekitani, Makoto Takamiya, Takao Someya, Takayasu Sakurai

Society for Information Display Symposium Digest of Technical Papers   47 ( 1 )   629 - 632   2016.5

Statistical Analysis and Modeling of Random Telegraph Noise Based on Gate Delay Variation Measurement Reviewed

A.K.M. Mahfuzul Islam, Tatsuya Nakai, Hidetoshi Onodera

2016 International Conference on Microelectronic Test Structures (ICMTS)   2016-May   82 - 87   2016.3

On-chip Monitoring and Compensation Scheme with Fine-grain Body Biasing for Robust and Energy-Efficient Operations Invited Reviewed

A.K.M. Mahfuzul Islam, Hidetoshi Onodera

Proc. of 2016 Asia and South-Pacific Design Automation Conference   25-28-January-2016   403 - 409   2016.1

Wide-Supply-Range All-Digital Leakage Variation Sensor for On-Chip Process and Temperature Monitoring Reviewed

A. K. M. Mahfuzul Islam, Jun Shiomi, Tohru Ishihara, Hidetoshi Onodera

IEEE JOURNAL OF SOLID-STATE CIRCUITS   50 ( 11 )   2475 - 2490   2015.11

Characterization of Gate Width Dependency on Random Telegraph Noise using Reconfigurable Ring Oscillator for Compact Statistical Modeling Reviewed

A.K.M. Mahfuzul Islam, Tatsuya Nakai, Hidetoshi Onodera

IEEE/ACM Workshop on Variability Modeling and Characterization   2015.11

Statistical Analysis of Random Telegraph Noise with Reconfigurable Ring Oscillator

Tatsuya, Nakai, A.K.M., Mahfuzul Islam, Hidetoshi, Onodera

2015   95 - 100   2015.8

Energy reduction by built-in body biasing with single supply voltage operation Reviewed

N. Kamae, A.K.M. Mahfuzul Islam, A. Tsuchiya, H. Onodera

International Symposium on Quality Electronic Devices   2015-April   181 - 185   2015.3

Sensitivity-independent Extraction of Vth Variation Utilizing Log-normal Delay Distribution Reviewed

A.K.M.Mahfuzul Islam, Hidetoshi Onodera

Proceedings of the 2015 IEEE International Conference on Microelectronic Test Structures   2015-May   212 - 217   2015.3

Characterization and compensation of performance variability using on-chip monitors Invited Reviewed

A.K.M. Mahfuzul Islam, Hidetoshi Onodera

2014 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)   19 - 22   2014.4

Area-efficient reconfigurable ring oscillator for device and circuit level characterization of static and dynamic variations Reviewed

A. K. M. Mahfuzul Islam, Hidetoshi Onodera

JAPANESE JOURNAL OF APPLIED PHYSICS   53 ( 4 )   04EE01 - 043308   2014.4

Cell-based Physical Design Automation for Analog and Mixed Signal Application Reviewed

Norihiro Kamae, A.K.M Mahfuzul Islam, Akira Tsuchiya, Hidetoshi Onodera

ACM International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems   2014.3

Wide-Supply-Range All-Digital Leakage Variation Sensor for On-chip Process and Temperature Monitoring Reviewed

A. K. M. Mahfuzul Islam, Jun Shiomi, Tohru Ishihara, Hidetoshi Onodera

2014 IEEE ASIAN SOLID-STATE CIRCUITS CONFERENCE (A-SSCC)   45 - 48   2014

In-Situ Variability Characterization of Individual Transistors Using Topology-Reconfigurable Ring Oscillators Reviewed

A. K. M. Mahfuzul Islam, Hidetoshi Onodera

2014 IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES (ICMTS)   121 - 126   2014

A Body Bias Generator with Wide Supply-Range down to Threshold Voltage for Within-Die Variability Compensation Reviewed

Norihiro Kamae, A. K. M. Mahfuzul Islam, Akira Tsuchiya, Hidetoshi Onodera

2014 IEEE ASIAN SOLID-STATE CIRCUITS CONFERENCE (A-SSCC)   53 - 56   2014

Energy-efficient Dynamic Voltage and Frequency Scaling by P/N-performance Self-adjustment using Adaptive Body Bias Reviewed

A.K.M. Mahfuzul Islam, Norihiro Kamae, Tohru Ishihara, Hidetoshi Onodera

Proceedings of SASIMI   2013.10

Area-efficient Reconfigurable Ring Oscillator for Characterization of Static and Dynamic Variations Reviewed

A.K.M. Mahfuzul Islam, Hidetoshi Onodera

International Conference on Solid State Devices and Materials   132 - 133   2013.9

On-Chip Detection of Process Shift and Process Spread for Post-Silicon Diagnosis and Model-Hardware Correlation Reviewed

A. K. M. Mahfuzul Islam, Hidetoshi Onodera

IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS   E96D ( 9 )   1971 - 1979   2013.9

Inhomogeneous ring oscillator for within-die variability and RTN characterization Reviewed

Shuuichi Fujimoto, A. K.M. Mahfuzul Islam, Takashi Matsumoto, Hidetoshi Onodera

IEEE Transactions on Semiconductor Manufacturing   26 ( 3 )   296 - 305   2013

Reconfigurable Delay Cell for Area-efficient Implementation of On-chip MOSFET Monitor Schemes Reviewed

A. K. M. Mahfuzul Islam, Tohru Ishihara, Hidetoshi Onodera

PROCEEDINGS OF THE 2013 IEEE ASIAN SOLID-STATE CIRCUITS CONFERENCE (A-SSCC)   125 - 128   2013

Variation-Sensitive Monitor Circuits for Estimation of Global Process Parameter Variation Reviewed

Islam A. K. M. Mahfuzul, Akira Tsuchiya, Kazutoshi Kobayashi, Hidetoshi Onodera

IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING   25 ( 4 )   571 - 580   2012.11

Inhomogeneous Ring Oscillator for WID Variability and RTN Characterization Reviewed

Shuuichi Fujimoto, A.K.M. Mahfuzul Islam, Takashi Matsumoto, Hidetoshi Onodera

IEEE International Conference on Microelectronic Test Structures   25 - 30   2012.3

On-chip detection of process shift and process spread for silicon debugging and model-hardware correlation Reviewed

Islam A.K.M. Mahfuzul, Hidetoshi Onodera

Proceedings of the Asian Test Symposium   350 - 354   2012

A Built-in Self-adjustment Scheme with Adaptive Body Bias using P/N-sensitive Digital Monitor Circuits Reviewed

Islam A. K. M. Mahfuzul, Norihiro Kamae, Tohru Ishihara, Hidetoshi Onodera

2012 IEEE ASIAN SOLID STATE CIRCUITS CONFERENCE (A-SSCC)   101 - 104   2012

Variation-sensitive Monitor Circuits for Estimation of Die-to-Die Process Variation Reviewed

Islam A. K. M. Mahfuzul, Akira Tsuchiya, Kazutoshi Kobayashi, Hidetoshi Onodera

2011 IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES (ICMTS)   2011

Component Analysis of WID Variation Reviewed

Shuuichi Fujimoto, A.K.M. Mahfuzul Islam, Shinichi Nishizawa, Hidetoshi Onodera

IEEE International Workshop on Design for Manufacturability & Yield,   2010.3

Process-sensitive Monitor Circuits for Estimation of Die-to-Die Process Variability, Reviewed

A.K.M. Mahfuzul Islam, Akira Tsuchiya, Kazutoshi Kobayashi, Hidetoshi Onodera

ACM International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems   83 - 88   2010.3

C-12-31 Trade-off between Image Recognition Rate and Energy Consumption in Artificial Neural Network Engines

Chae Jeonghun, Islam A.K.M. Mahfuzul, Sakurai Takayasu, Takamiya Makoto

Proceedings of the IEICE General Conference   2016 ( 2 )   104   2016.3

Analyzing the Impacts of Simultaneous Supply and Threshold Voltage Tuning on Energy Dissipation in VLSI Circuits

TAKESHITA Toshihiro, NISHIZAWA Shinichi, ISLAM A.K.M. Mahfuzul, ISHIHARA Tohru, ONODERA Hidetoshi

Technical report of IEICE. VLD   114 ( 426 )   111 - 116   2015.1

Characterization and Compensation of Performance Variability Using On-chip Monitor Circuits

27   223 - 228   2014.8

SLDM研究会優秀発表賞

2023.8   情報処理学会   MOSFETのサブスレッショルド電流を利用した適応的周波数変調によるディジタルLDOの低消費電力設計

山口 駿

Best Paper Award

2023.3   IEEE International Conference on Microelectronic Test Structures   Measurement of temperature effect on comparator offset voltage variation

Yuma Iwata, Takehiro Kitamura, Mahfuzul Islam

Best Design Award

2023.1   IEEE ASP-DAC University Design Contest   A fully synchronous digital LDO with built-in adaptive frequency modulation and implicit dead-zone control

Shun Yamaguchi, Mahfuzul Islam, Takashi Hisakado, Osami Wada

デザインコンテスト奨励賞

2022.9   VDEC   サブスレッショルド電流を利用した周波数変調回路と 単一参照電圧を用いた Dead-zone 制御を搭載したディジタルLDO

山口 駿

IPSJ Computer Science Research Award for Young Scientists

2022.8   Information Processing Society of Japan   Homogeneous Ring Oscillator with Staggered Layout for Delay Variability Characterization

Misaki Udo, Mahfuzul Islam, Hidetoshi Onodera

AJJC Academic Research Award

2021.8   IEEE CEDA   Design of reference-free CMOS temperature sensor with statistical MOSFET selection

Shogo Harada, Mahfuzul Islam, Takashi Hisakado, Osami Wada

セッション特別賞

2021.8   情報処理学会   電源電圧と基板電圧の動的調整がランダムテレグラフに起因する遅延ばらつきに及ぼす影響

有働岬

セッション特別賞

2021.8   情報処理学会   しきい値電圧差を利用した時間領域処理による広い電源電圧で動作するCMOS温度センサ

原田彰吾

山下記念研究賞

2021.3   情報処理学会   MOSFETの統計的選択によるレファレンス不要なCMOS温度センサの設計

Best Paper Award

2017.3   IEEE International Conference on Microelectronic Test Structure (ICMTS)   A statistical modeling methodology of RTN gate size dependency based on skewed ring oscillators

山下記念研究賞

2015.3   情報処理学会   ポロジー可変な遅延モニタ回路を用いたトランジスタ毎の静的及び動的特性ばらつきの評価

コンピュータサイエンス領域奨励賞

2014.8   情報処理学会   チップ間およびチップ内ばらつきを評価可能な再構成可能遅延モニタ回路

優秀発表学生賞

2014.8   情報処理学会   チップ間およびチップ内ばらつきを評価可能な再構成可能遅延モニタ回路

SLDM研究会 優秀論文賞

2014.8   情報処理学会   完全ディジタル型のP/Nばらつきの自律補償回路

丹羽保次郎記念論文賞

2014.2   東京電機大学   Variation-sensitive Monitor Circuits for Estimation of Global Process Parameter Variation

Student Design Contest Award

2013.11   IEEE Asian Solid-State Circuits Conference   Reconfigurable Delay Cell for Area-efficient Implementation of On-chip MOSFET Monitor Schemes

優秀発表学生賞

2013.8   情報処理学会   完全ディジタル型の P/Nばらつきの自律補償回路

学生研究奨励賞

2011.12   IEEE関西支部  

畠山賞

2007.3   日本機械学会  

Low-power design of CMOS sensor circuits utilizing device mismatch

Grant number：19K20233  2019.4 - 2022.3

Japan Society for the Promotion of Science  Grants-in-Aid for Scientific Research Grant-in-Aid for Early-Career Scientists  Grant-in-Aid for Early-Career Scientists

Mahfuzul Islam

ゲート波形の機械学習手法に基づいた劣化状況及びデバイス接合温度のリアルタ イム診断システムの開発

2018.4 - 2020.3

ローム株式会社  共同研究 

瞬時消費電力を最小化するスタンダードセルライブラリの構成法

2018.4 - 2020.3

ローム株式会社  共同研究 

発展途上国におけるIoT普及に関するケーススタディ

2017.4 - 2018.3

東京大学生産技術研究所  所長エンカレッジプロジェクト 

LSI design methodology that enables robust operation under the supply as low as threshold voltage by self-compensating performance variability

Grant number：25280014  2013.4 - 2017.3

Japan Society for the Promotion of Science  Grants-in-Aid for Scientific Research  Grant-in-Aid for Scientific Research (B)

ONODERA Hidetoshi, NISHIZAWA Sinichi, Mahfuzul Islam A. K. M.

特性ばらつきの自律補償技術とそれを活用したＬＳＩの低消費電力化手法に関する研究

Grant number：13J06432  2013.4 - 2015.3

日本学術振興会  科学研究費助成事業 特別研究員奨励費  特別研究員奨励費

イスラム マーフズル